Please use this identifier to cite or link to this item: http://repositorio.ufpa.br/jspui/handle/2011/4282
metadata.dc.type: Artigo de Periódico
Issue Date: Dec-2006
metadata.dc.creator: OLIVEIRA, Terezinha Ferreira de
AVILLEZ, Roberto Ribeiro de
EPPRECHT, Eugenio Kahn
QUEIROZ, Joaquim Carlos Barbosa
Title: Evaluation via multivariate techniques of scale factor variability in the rietveld method applied to quantitative phase analysis with X ray powder diffraction
Citation: OLIVEIRA, Terezinha Ferreira de, et al. Evaluation via multivariate techniques of scale factor variability in the rietveld method applied to quantitative phase analysis with X ray powder diffraction. Materials Research, São Carlos, v. 9, n. 4, p. 369-374, out./dez. 2006. Disponível em: <http://www.scielo.br/pdf/mr/v9n4/04.pdf>. Acesso em: 26 set. 2013. <http://dx.doi.org/10.1590/S1516-14392006000400005>.
Abstract: The present work uses multivariate statistical analysis as a form of establishing the main sources of error in the Quantitative Phase Analysis (QPA) using the Rietveld method. The quantitative determination of crystalline phases using x ray powder diffraction is a complex measurement process whose results are influenced by several factors. Ternary mixtures of Al2O3, MgO and NiO were prepared under controlled conditions and the diffractions were obtained using the Bragg-Brentano geometric arrangement. It was possible to establish four sources of critical variations: the experimental absorption and the scale factor of NiO, which is the phase with the greatest linear absorption coefficient of the ternary mixture; the instrumental characteristics represented by mechanical errors of the goniometer and sample displacement; the other two phases (Al2O3 and MgO); and the temperature and relative humidity of the air in the laboratory. The error sources excessively impair the QPA with the Rietveld method. Therefore it becomes necessary to control them during the measurement procedure.
Keywords: Análise multivariada
Análise quantitativa
Método Rietveld
ISSN: 1980-5373
1516-1439
metadata.dc.rights: Acesso Aberto
Appears in Collections:Artigos Científicos - FAEST/ICEN

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